Nr.
No.		Autoren
Authors		Titel
Title		Zeitschrift Ausgabe (Jahr) Seiten
Journal issue (year) pages
Nr. anklicken, um Publikation als PDF-Datei zu laden. Copyright beachten!
Click No. for download in PDF format. Any commercial utilization of the contents infringes the copyright. Download and printout of the documents is permitted for private use only.
1M. Hoheisel
R. Carius
W. Fuhs		Low Temperature Photoconductivity in a-Si:H FilmsJournal of Non-Crystalline Solids 59&60 (1983) 457-460
2M. Hoheisel
R. Carius
W. Fuhs		Photoconductivity and Photoluminescence of a-Si:H at Low TemperatureJournal of Non-Crystalline Solids 63 (1984) 313-319
3R. Carius
W. Fuhs
M. Hoheisel		Infrared Quenching of Photoluminescence and Photoconductivity in a-Si:HJournal of Non-Crystalline Solids 66 (1984) 151-156
4K. Kempter
H. Wieczorek
M. Hoheisel		Influence of Transparent Electrodes on Image Sensor PerformanceMaterials Research Society Symposium Proceedings 49 (1985) 429-434
5M. Hoheisel
H. Wieczorek
K. Kempter		Characterization of Junctions between Transparent Electrodes and a-Si:HJournal of Non-Crystalline Solids 77&78 (1985) 1413-1416
6M. Hoheisel
G. Brunst
H. Wieczorek		Physical Aspects of a-Si:H Image SensorsJournal of Non-Crystalline Solids 90 (1987) 243-246
7M. Hoheisel
N. Brutscher
H. Oppolzer
S. Schild		The Interfaces a-Si:H/Pd and a-Si:H/ITO: Structure and Electronic PropertiesJournal of Non-Crystalline Solids 97&98 (1987) 959-962
8N. Brutscher
M. Hoheisel		Schottky Diodes with High Series Resistance: A Simple Method of Determining the Barrier HeightsSolid-State Electronics 31 (1988) 87-89
9M. Hoheisel
W. Fuhs		Drift Mobility in n- and p-Conducting a-Si:HPhilosophical Magazine B 57 (1988) 411-419
10A. Mitwalsky
M. Hoheisel
W. Müller
C. Mrotzek		Microstructure and Interface of Indium-Tin-Oxide Contacts on Hydrogenated Amorphous SiliconProceedings of the 9th European Conference on Electron Microscopy, York 1988, Inst. Phys. Conf. Ser. No. 93, 2 (1988) 107-108
11M. Hoheisel
N. Brutscher
H. Wieczorek		Relaxation Phenomena of Image Sensors made from a-Si:HJournal of Applied Physics 66 (1989) 4466-4473
12M. Hoheisel
N. Brutscher
H. Wieczorek		Ambient-Induced Defect States at a-Si:H/ITO InterfacesJournal of Non-Crystalline Solids 115 (1989) 114-116
13M. Hoheisel
S. Heller
C. Mrotzek
A. Mitwalsky		Anvanced Transparent Conductive Oxide Electrode for Optoelectronic Thin-Film DevicesSolid State Communications 76 (1989) 1-3
14M. Hoheisel
A. Mitwalsky
C. Mrotzek		Microstructure and Etching Properties of Sputtered Indium-Tin Oxide (ITO)physica status solidi (a) 123 (1991) 461-472
15J. Kocka
O. Klima
G. Juska
M. Hoheisel
R. Plättner		SCLC Transients in a-Si:H – New Features and PossibilitiesJournal of Non-Crystalline Solids 137&138 (1991) 427-430
16M. Hoheisel
O. Stika
J. Kocka		Systematic Study of the Influence of Contacts on CPM ResultsJournal of Non-Crystalline Solids 137&138 (1991) 615-618
17M. Hoheisel
E. Reichle
H. Harms
J. Kotschy		Temperature Dependence of the Photocurrent in pin and nip Solar Cell Structures made from a-Si:HJournal of Non-Crystalline Solids 137&138 (1991) 1181-1184
18J. Kocka
O. Klima
E. Sipek
C. E. Nebel
G. H. Bauer
G. Juska
M. Hoheisel		a-Si:H Electron Drift Mobility Measured under Extremely High Electric FieldPhysical Review B 45 (1992) 6593-6600
19G. Juska
K. Arlauskas
J. Kocka
M. Hoheisel
P. Chabloz		Hot Electrons in Amorphous SiliconPhysical Review Letters 75 (1995) 2984-2987
20J. Chabbal
C. Chaussat
T. Ducourant
L. Fritsch
J. Michailos
V. Spinnler
G. Vieux
M. Arques
G. Hahm
M. Hoheisel
H. Horbaschek
R. Schulz
M. Spahn		Amorphous Silicon X-Ray Image SensorProceedings of SPIE Symposium “Medical Imaging 1996” 10-15 Feb. 1996, Newport Beach USA, 2708 (1996) 499-510
21M. Hoheisel
M. Arques
J. Chabbal
C. Chaussat
T. Ducourant
L. Fritsch
G. Hahm
H. Horbaschek
J. Michailos
R. Schulz
M. Spahn
V. Spinnler
G. Vieux		Amorphous Silicon X-Ray DetectorsProceedings of the 9th International School on Condensed Matter Physics “Future Directions in Thin Film Science and Technology” 9 – 13 Sept. 1996, Varna Bulgaria, Ed. J. M. Marshall, N. Kirov, A. Vavrek, J. M. Maud (1996) 112-120
22M. Hoheisel
M. Arques
J. Chabbal
C. Chaussat
T. Ducourant
G. Hahm
H. Horbaschek
R. Schulz
M. Spahn		Amorphous Silicon X-Ray DetectorsJournal of Non-Crystalline Solids 227&230 (1998) 1300-1305
23M. Hoheisel
L. Bätz		Requirements on amorphous semiconductors for medical X-Ray detectorsJournal of Non-Crystalline Solids 266&269 (2000) 1152-1157
24M. Hoheisel
L. Bätz		Requirements on amorphous semiconductors for medical X-Ray detectorsThin Solid Films 383 (2001) 132-136
25K.-F. G. Pfeiffer
J. Giersch
G. Anton
L. Bätz
M. Hoheisel		Large-scale images taken with the Medipix-1 chipNuclear Instruments and Methods in Physics Research A 509 (2003) 340-348
26M. Hoheisel
J. Giersch
M. Mitschke
P. Bernhardt
Absorbers for medical X-ray detectors with optimum spatial resolution: a simulation studyProceedings of SPIE Symposium “Medical Imaging 2004” 5368 (2004) 386-395
27M. Hoheisel
J. Giersch
P. Bernhardt		Intrinsic spatial resolution of semiconductor X-ray detectors: a simulation studyNuclear Instruments and Methods in Physics Research A 531/1-2 (2004) 75-81
28M. Hoheisel
A. Korn
J. Giersch		Influence of backscattering on the spatial resolution of semiconductor X-ray detectorsNuclear Instruments and Methods in Physics Research A 546 (2005) 252-257
29M. Hoheisel
L. Bätz
T. Mertelmeier
J. Giersch
A. Korn		Modulation transfer function of a selenium-based digital mammography systemIEEE Proceedings of the Nuclear Science Symposium, Medical Imaging Conference (2004) 3589-3593
30A. Korn
J. Giersch
M. Hoheisel		Simulation of internal backscatter effects on MTF and SNR of pixelated photon-counting detectorsProceedings of SPIE 5745 (2005) 292-298
31P. Bernhardt
L. Bätz
E.-P. Rührnschopf
M. Hoheisel		Spatial frequency-dependent signal-to-noise ratio as a generalized measure of image qualityProceedings of SPIE 5745 (2005) 407-418
32M. Hoheisel
R. Lawaczeck
H. Pietsch
V. Arkadiev		Advantages of monochromatic X-rays for imagingProceedings of SPIE 5745 (2005) 1087-1095
33M. Hoheisel
P. Bernhardt
R. Lawaczeck
H. Pietsch		Comparison of polychromatic and monochromatic X-rays for imagingProceedings of SPIE 6142 (2006) 614209-1 – 614209-8
34M. HoheiselReview of medical imaging with emphasis on X-ray detectorsNuclear Instruments and Methods in Physics Research A 563 (2006) 215-224
35M. Hoheisel
L. Bätz
T. Mertelmeier
J. Giersch
A. Korn		Modulation transfer function of a selenium-based digital mammography systemIEEE Transactions on Nuclear Science 53 (2006) 1118-1122
36P. Bernhardt
T. Mertelmeier
M. Hoheisel		X-ray spectrum optimization of full-field digital mammography: Simulation and phantom studyMedical Physics 33 (2006) 4337-4349
37M. Nagel
M. Hoheisel
R. Petzold
W. A. Kalender
U. H. W. Krause		Needle and catheter navigation using electromagnetic tracking for computer-assisted C-arm CT interventionsProceedings of SPIE 6509 (2007) 65090J-1 – 65090J-9
38B. C. Meyer
M. H. Nagel
O. Peter
M. Witschel
M. Hoheisel
K. J. Wolf
F. K. Wacker		Phantomstudie zum Einsatz eines elektromagnetischen Navigationssystems unter Verwendung angiographischer CT-DatensätzeFortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebenden Verfahren 179 (2007) VO_216_2
39F. K. Wacker
B. Meyer
M. H. Nagel
M. Hoheisel
V. Trösken
O. Peter
K. J. Wolf		Rekanalisation von arteriellen Stenosen und Verschlüssen mithilfe von angiographischen CT-Datensätzen und einer magnetischen Katheter-VerfolgungFortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebenden Verfahren 179 (2007) VO_317_8
40M. Nagel
M. Hoheisel
U. Bill
K. Klingenbeck-Regn
W. A. Kalender
R. Petzold		Electromagnetic tracking system for minimal invasive interventions using a C-arm system with CT option: First clinical resultsProceedings of SPIE 6918 (2008) 69180G-1 – 69180G-10
41B. C. Meyer
O. Peter
M. Nagel
M. Hoheisel
B. B. Frericks
K.-J. Wolf
F. K. Wacker		Electromagnetic field-based navigation for percutaneous punctures on C-arm CT: experimental evaluation and clinical applicationEuropean Radiology 18 (2008) 2855-2864
42N. Strobel
O. Meissner
J. Boese
T. Brunner
B. Heigl
M. Hoheisel
G. Lauritsch
M. Nagel
M. Pfister
E.-P. Rührnschopf
B. Scholz
B. Schreiber
M. Spahn
M. Zellerhoff
K. Klingenbeck-Regn		Imaging with flat-detector C-arm systemsMultislice CT, Editors: M. F. Reiser, C. R. Becker, K. Nicolaou, G. Glazer, Springer-Verlag (2008) 33-51
43T. Donath
F. Pfeiffer
O. Bunk
W. Groot
M. Bednarzik
C. Grünzweig
E. Hempel
S. Popescu
M. Hoheisel
C. David		Phase-contrast imaging and tomography at 60 keV using a conventional X-ray tubeProceedings of SPIE 7078 (2008) 707817-1 – 707817-8
44M. Hoheisel
M. Skalej
O. Beuing
U. Bill
K. Klingenbeck-Regn
R. Petzold
M. H. Nagel		Kyphoplasty interventions using a navigation system and C-arm CT data: first clinical resultsProceedings of SPIE 7258 (2009) 72580E-1 – 72580E-8
45T. Donath
F. Pfeiffer
O. Bunk
W. Groot
M. Bednarzik
C. Grünzweig
E. Hempel
S. Popescu
M. Hoheisel
C. David		Phase-contrast imaging and tomography at 60 keV using a conventional X-ray tube sourceReview of Scientific Instruments 80 (2009) 053701-1 – 053701-4
46T. Donath
M. Chabior
F. Pfeiffer
O. Bunk
E. Reznikova
J. Mohr
E. Hempel
S. Popescu
M. Hoheisel
M. Schuster
J. Baumann
C. David		Inverse geometry for grating-based X-ray phase-contrast imagingJournal of Applied Physics 106 (2009) 054703-1 – 054703-7
47N. Blanc
P. Giffard
P. Seitz
P. Buchschacher
V. Nguyen
M. Hoheisel		Semiconductor image sensingMore than Moore / Creating High Value Micro/Nanoelectronics Systems, Editors: G. Q. Zhang, A. J. van Roosmalen, Springer-Verlag (2009) 65-112
48Y. Lu
M. Berger
M. Manhart
J. Choi
M. Hoheisel
M. Kowarschik
R. Fahrig
Q. Ren
J. Hornegger
A. Maier		Bridge to real data: Empirical multiple material calibration for learning-based material decompositionIEEE 13th International Symposium on Biomedical Imaging (ISBI) (2016) 457-460